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Applications of New Absolute Measurements of X-rays and γ-rays

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Quantum Metrology and Fundamental Physical Constants

Part of the book series: NATO Advanced Science Institutes Series ((NSSB,volume 98))

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Abstract

Technology described in the previous lecture has resulted in a number of secondary standards in the gamma-ray region together with convenient accurate procedures for remeasurement of X-ray lines. Emphasis in this lecture is on use of the gamma reference lines to normalize exotic atom spectra and systematic studies of normal X-ray spectra in relation to relativistic self consistent field calculations [1].

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References

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Author information

Authors and Affiliations

  1. Center for Absolute Physical Quantities, National Bureau of Standards, Washington, D.C., 20234, USA

    Richard D. Deslattes

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  1. Richard D. Deslattes
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Editors and Affiliations

  1. The Pennsylvania State University, 104 Davey Laboratory, University Park, Pennsylvania, 16802, USA

    Paul H. Cutler

  2. Department de Physique, Facultes Universite Notre-Dame de la Paix, 61, rue de Bruxelles, 5000, Namur, Belgium

    Amand A. Lucas

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© 1983 Springer Science+Business Media New York

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Deslattes, R.D. (1983). Applications of New Absolute Measurements of X-rays and γ-rays. In: Cutler, P.H., Lucas, A.A. (eds) Quantum Metrology and Fundamental Physical Constants. NATO Advanced Science Institutes Series, vol 98. Springer, Boston, MA. https://doi.org/10.1007/978-1-4899-2145-1_18

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  • DOI: https://doi.org/10.1007/978-1-4899-2145-1_18

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4899-2147-5

  • Online ISBN: 978-1-4899-2145-1

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