On the Structural Quality of Co/Cu Trilayers and Superlattices: The Influence of the Template Layer
Structural imperfections and chemical intermixing can strongly influence the magnetic properties of metallic superlattices. Co/Cu multilayers grown by sputtering on Si(100) and Si(111) substrates with intermediate seed layers (Cu, Fe, Ru) have been found to display oscillatory MR effects. It has been claimed that the structural quality of multilayers grown on seed layers is high and, in particular, that a 50 Å thick Fe buffer layer provides a template for growth as good as a Cu(100) single crystal . In this work we report on extensive characterization by several diffraction techniques of the detailed crystallography, degree of intermixing and interfacial roughness of Co/Cu trilayers and superlattices grown by MBE on Cu(100) substrates under UHV conditions. Neutron and X-ray diffraction (for superlattices) and LEED (for trilayers) experimental data are compared to detailed calculations (kinematic and dynamic) of the diffracted intensities. On the other hand, the degree of perfection of Fe overlayers deposited on Si wafers and the extent of chemical reaction that takes place at the Fe/Si are also characterized. The data demonstrate that the buffer layers deposited on Si that we have studied represent a template of much lower crystalline quality than Cu single crystals for further growth of Co/Cu superlattices.
KeywordsSeed Layer Misfit Dislocation Sharp Interface Superlattice Peak Template Layer
Unable to display preview. Download preview PDF.
- J. J. de Miguel, A. Cebollada, J. M. Gallego, R. Miranda, C. M. Schneider, P. Schuster and J. Kirschner,J. Magn. Mag. Mat. 93(1991) 1, and references therein.Google Scholar
- V. F. Sears, “Thermal Nautron Scattering Lengths and Cross Sections for Condensed Matter Research”, Chalk River Nuclear Laboratory, Ontario (1984).Google Scholar
- G. E. Bacon, “Neutron Diffraction”, Oxford University Press (1975).Google Scholar
- E. Navas et. al. (in preparation).Google Scholar
- D. Chandersis et. al. (this issue).Google Scholar
- J. L. Martinez-Albertos et. al. ,J. Magn. Mag. Mat.(submitted).Google Scholar