Abstract
We have used scanning electron microscopy with polarization analysis (SEMPA) to investigate the magnetic exchange coupling between an Fe film and an Fe whisker separated by either a Cr or Ag spacer layer. The thickness dependence of the oscillatory coupling in these atomically well ordered, epitaxial films was precisely measured. The periodicity of the exchange coupling is consistent with predictions based on Fermi surface spanning vectors of the interlayer material.
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Unguris, J., Pierce, D.T., Celotta, R.J., Stroscio, J.A. (1993). Sempa Studies of Oscillatory Exchange Coupling. In: Farrow, R.F.C., Dieny, B., Donath, M., Fert, A., Hermsmeier, B.D. (eds) Magnetism and Structure in Systems of Reduced Dimension. NATO ASI Series, vol 309. Springer, Boston, MA. https://doi.org/10.1007/978-1-4899-1519-1_10
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