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Discussion

  • Loucas G. Christophorou
  • David R. James

Keywords

Defect Size Breakdown Voltage Minimum Break Critical Defect Critical Defect Size 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Copyright information

© Springer Science+Business Media New York 1994

Authors and Affiliations

  • Loucas G. Christophorou
    • 1
  • David R. James
    • 1
  1. 1.Oak Ridge National LaboratoryOak RidgeUSA

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