Abstract
Electron spectroscopy is applied to the analysis of surfaces in several thousand laboratories worldwide. It is a pervasive activity, spread across a wide range of scientific and technological subject areas, and has experienced a period of rapid and continued growth since its emergence from pure research in the late 1960s and early 1970s. There is some evidence to suggest that the principle electron spectroscopic techniques of surface analysis, namely X-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES), have now reached a stage of maturity in their development at which they can be applied in a routine manner to solve practical problems alongside the more conventional techniques found in the well-equipped analytical laboratory. Applications occur in all the technologically advanced industries.
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© 1994 Springer Science+Business Media New York
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Smith, G.C. (1994). Introduction. In: Surface Analysis by Electron Spectroscopy. Updates in Applied Physics and Electrical Technology. Springer, Boston, MA. https://doi.org/10.1007/978-1-4899-0967-1_1
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DOI: https://doi.org/10.1007/978-1-4899-0967-1_1
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4899-0969-5
Online ISBN: 978-1-4899-0967-1
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