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Internal Reflection Spectroscopy

  • W. Suëtaka
  • John T. YatesJr.
Part of the Methods of Surface Characterization book series (MOSC, volume 3)

Abstract

When a beam of light is incident at an angle of incidence, φ1, on a plane interface from a transparent medium 1, part of the light is reflected at the interface and travels back in the plane of incidence, as shown in Fig. 1. In this specular or regular reflection, the angle of reflection equals the angle of incidence. If medium 1 is optically denser than medium 2, i. e., n 1 > n 2, this reflection is called internal reflection.

Keywords

Attenuate Total Reflection Critical Angle Absorption Enhancement External Reflection Surface Electromagnetic Wave 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer Science+Business Media New York 1995

Authors and Affiliations

  • W. Suëtaka
    • 1
  • John T. YatesJr.
    • 2
  1. 1.Tohoku UniversityTsuchiuraJapan
  2. 2.Surface Science CenterUniversity of PittsburghPittsburghUSA

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