Characterization of CMOS Process Variations by Measuring Subthreshold Current
Analog integrated circuit performance depends on the matching characteristics of individual components; transistors, resistors or capacitors. For example, in a current mirror, two identically biased transistors that are designed to have the same geometry, are said to be matched if their drain currents are equal. Transistor mismatch is one of the more acute problems in the advancement of analog VLSI collective computational systems .
KeywordsThreshold Voltage Drain Current Test Chip Subthreshold Region Analog VLSI
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