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Surface Energetics and Dynamics Measured from STM Movies

  • M. S. Hoogeman
  • D. C. Schlößer
  • J. B. Sanders
  • L. Kuipers
  • M. F. Chang
  • M. A. J. Klik
  • D. Glastra van Loon
  • R. W. M. Loos
  • J. J. van der Linden
  • J. W. M. Frenken
Part of the NATO ASI Series book series (NSSB, volume 360)

Abstract

We describe a high-speed programmable-temperature scanning tunneling microscope (STM) for the study of dynamical processes and the measurement of various energies on metal surfaces. The programmable-temperature STM operates in the temperature range from 60 to 1000 K. Over a temperature window of 300 K it can keep one particular surface area in view. We present two experimental results obtained with this instrument. The first concerns the energetics of a vicinal surface, Ag(115), and their relation with the surface roughening transition. The second treats the diffusion dynamics of kinks in steps on the (110) surface of Au.

Keywords

Scanning Tunneling Micro Scanning Tunneling Micro Image Atomic Spacing Vertical Drift Vicinal Surface 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

  1. 1.
    L. Kuipers, M.S. Hoogeman, and J.W.M. Frenken, Phys. Rev. Lett. 71, 3517 (1993).ADSCrossRefGoogle Scholar
  2. L Kuipers, M.S. Hoogeman, J.W.M. Frenken, and H. van Beijeren, Phys. Rev. B. 52, 11387, (1995).ADSCrossRefGoogle Scholar
  3. 2.
    L. Masson, L. Barbier, J. Cousty, and B. Salanon, Surf. Sci. 317, L1115 (1994).CrossRefGoogle Scholar
  4. 3.
    B.S. Swartzentruber, Y.-W. Mo, R. Kariotis, M.G. Lagally, and M.B. Webb, Phys. Rev. Lett. 65, 1913 (1990).ADSCrossRefGoogle Scholar
  5. 4.
    M. Giesen-Seibert, R. Jentjens, M. Poensgen, and H. Ibach, Phys. Rev. Lett. 71, 3521 (1994); ibid. erratum 73, 911 (1994).ADSCrossRefGoogle Scholar
  6. 5.
    H.J.W. Zandvliet, H. Wormeester, D.J. Wentink, A. van Silfhout, and H.B. Elswijk, Phys. Rev. Lett. 70, 2122 (1993).ADSCrossRefGoogle Scholar
  7. 6.
    B.S. Swartzentruber, Phys. Rev. Lett. 76, 459 (1996).ADSCrossRefGoogle Scholar
  8. 7.
    J. Villain, D.R. Grempel, and J. Lapujoulade, J. Phys. F:Met. Phys. 15, 809 (1985).ADSCrossRefGoogle Scholar
  9. 8.
    M.S. Hoogeman, D. Glastra van Loon, R.W.M. Loos, J.J. van der Linden, L. Kuipers, M.F. Chang, M.A.J. Klik, B.K. Ambrose, T.J. Palmer, and J.W.M Frenken, to be published.Google Scholar
  10. 9.
    L. Kuipers, R.W.M. Loos, H. Neerings, J. ter Horst, G.J. Ruwiel, A.P. de Jongh, and J.W.M. Frenken, Rev. Sci. Instrum. 66, 4557, (1995).ADSCrossRefGoogle Scholar
  11. 10.
    L. Kuipers, Ph.D. thesis, Amsterdam 1994.Google Scholar
  12. 11.
    E. Carlon, Ph.D. thesis, Utrecht 1995.Google Scholar
  13. 12.
    R. Berndt PhD Thesis, University of Basel 1992;.Google Scholar
  14. J.K. Gimzewski, R. Berndt and R.R. Schittler, Surf. Sci. 247, 327 (1991); ibid. Phys. Rev. B 45, 6844 (1992).ADSCrossRefGoogle Scholar
  15. 13.
    S. Speller, T. Rauch, W. Heiland, Surf. Sci. 342, 224 (1995).ADSCrossRefGoogle Scholar
  16. 14.
    I. Vilfan, private communication.Google Scholar
  17. 15.
    M.S. Hoogeman, D.C. Schlößer, J.B. Sanders, L. Kuipers, and J.W.M. Frenken, Phys. Rev. B 53, R13299 (1996).ADSCrossRefGoogle Scholar
  18. 16.
    J. Lapujoulade, Surf. Sci. Rep. 20, 191 (1994), and references therein.ADSCrossRefGoogle Scholar
  19. 17.
    J.A. Venables, G.D.T. Spiller, and M. Hanbücken, Reports on Progress in Physics 47, 399 (1984).ADSCrossRefGoogle Scholar
  20. 18.
    E.D. Williams, Surf. Sci. 299-300, 502 (1994).ADSCrossRefGoogle Scholar
  21. 19.
    J.D. Weeks, in Ordering in strongly fluctuating condensed matter systems, ed. T. Riste, Plenum, New York (1980), p. 293, and references therein.CrossRefGoogle Scholar
  22. 20.
    J.W.M. Frenken, R.J. Hamers, and J.E. Demuth, J. Vac. Sci. Technol. A 8, 293 (1990).ADSCrossRefGoogle Scholar
  23. 21.
    W. Selke and A.M. Szpilka, Z. Phys. B 62, 381 (1986).ADSCrossRefGoogle Scholar
  24. 22.
    W.J. Shugard, J.D. Weeks, and G.H. Gilmer, Phys. Rev. Lett. 41, 1399 (1978).ADSCrossRefGoogle Scholar
  25. 23.
    L. Barbier, L. Masson, J. Cousty, and B. Salanon, Surf. Sci. 345, 197 (1996).ADSCrossRefGoogle Scholar
  26. 24.
    M.S. Hoogeman, L. Kuipers, M.F. Chang, and J.W.M. Frenken, to be published.Google Scholar

Copyright information

© Springer Science+Business Media New York 1997

Authors and Affiliations

  • M. S. Hoogeman
    • 1
  • D. C. Schlößer
    • 2
  • J. B. Sanders
    • 1
  • L. Kuipers
    • 3
  • M. F. Chang
    • 1
  • M. A. J. Klik
    • 1
  • D. Glastra van Loon
    • 1
  • R. W. M. Loos
    • 1
  • J. J. van der Linden
    • 1
  • J. W. M. Frenken
    • 1
  1. 1.FOM-Institute for Atomic and Molecular PhysicsSJ AmsterdamThe Netherlands
  2. 2.IGV KFA Forschungszentrum Jülich GmbHJülichGermany
  3. 3.Nanoscale Physics Research LaboratoryUniversity of BirminghamEdgbaston, BirminghamUK

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