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Abstract

Yield models have been developed, analyzed, evaluated and discussed since the early 1960’s. Despite such a long and very often hot discussion [29,30,78] until now there has been no consensus as to which of them are the best, which are accurate enough and which of them possess adequate predictive capabilities. This situation is due, among other things, to the fact that yield models are very often evaluated by using very different, and not always explicitly defined, evaluation criteria. The goal of this paper is to indicate a number of simple yield model characteristics which could be used to improve comparison of different yield models.

Keywords

Yield Model Yield Loss Integrate Circuit Defect Tolerance Defect Density 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer Science+Business Media New York 1990

Authors and Affiliations

  • W. Maly
    • 1
  1. 1.Electrical and Computer Engineering Dept.Carnegie Mellon UniversityPittsburghUSA

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