Advertisement

Current Versus Voltage Characteristics for Deposition and Removal of Gold Nanostructures on a Gold Surface Using Scanning Tunneling Microscopy

  • J. M. Perez
  • J. L. Large

Abstract

We report the deposition and removal of gold nanostructures 50–200 A in diameter on a gold surface using scanning tunneling microscopy (STM) by applying a dc voltage to the tip. The dc voltage is applied using tunneling current versus voltage (I-V) spectroscopy. We observe the deposition of a gold nanostructure at a threshold voltage of approximately 2.8 V. The I-V curves show a large current after deposition consistent with a tip-sample connection. The fact that deposition occurs using a dc voltage supports this tip-sample connection. We also observe the removal of an existing nanostructure which leaves a pit behind on the surface by applying a dc voltage with the tip directly above the nanostructure. In this case, the I-V curves show no current consistent with no tip-sample connection being formed. We conjecture that an electric-field-induced force picks up the nanostructure in whole onto the tip. We propose that occasional pit formation is the result of a tip-sample connection which breaks while the tip is under bias.

Keywords

Threshold Voltage Scan Tunneling Microscopy Voltage Pulse Gold Surface Scan Tunneling Microscopy Image 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. 1.
    H.J. Mamin, P.I I. Guethner, and D. Rugar, Atomic emission from a gold scanning-tunnelingmicroscope tip, Phys. Rev. Lett., 65: 2418–2421 (1990).Google Scholar
  2. 2.
    S.E. McBride and G.C. Weisel, Jr., Nanometer-scale features produced by electric-field emission, Appl. Phys. Lett., 59: 3056–3058 (1991).CrossRefGoogle Scholar
  3. 3.
    C.S. Chang, W.B. Su, and T.T. Tsong, Field evaporation between a gold tip and a gold surface in the scanning tunneling microscope configuration, Phys. Rev. Lett., 72: 574–577 (1994).Google Scholar
  4. 4.
    J.I. Pascual, J. Mendez, J. Gomez-Herrero, A.M. Baro, N. Garcia, V. T. Binh, Quantum contact in gold nanostructures by scanning tunneling microscopy, Phys. Rev. Lett., 71:1852–1855 (1993).Google Scholar
  5. 5.
    J.L. Large and J.M. Perez, Current versus voltage characteristics for deposition and removal of nanometer gold structures from a gold substrate using STM, Spring 1992 Meeting of the Texas Section of the American Physical Society (1992).Google Scholar
  6. 6.
    Burleigh Instruments, Inc. Rochester, NY.Google Scholar
  7. 7.
    A.J. Melmed, The art and science and other aspects of making sharp tips, J. Vac. Sci. Technol., B9: 601–608 (1991).CrossRefGoogle Scholar
  8. 8.
    J.Schneir, R. Sonnenfeld, O. Marti, V.K. Hansma, J.E. Demuth, and R.J. Hamers, Tunneling microscopy, lithography, and surface diffusion on an easily prepared, atomically flat gold surface, J. Appl. Phys., 63: 717–721 (1988).CrossRefGoogle Scholar
  9. 9.
    U. Landman, W.D. Luedtke, N.A. Burnham, R.J. Colton, Atomistic mechanisms and dynamics of adhesion, nanoindentation, and fracture, Science, 40: 454–461 (1990).Google Scholar

Copyright information

© Springer Science+Business Media New York 1997

Authors and Affiliations

  • J. M. Perez
    • 1
  • J. L. Large
    • 1
    • 2
  1. 1.Department of PhysicsUniversity of North TexasDentonUSA
  2. 2.Department of PhysicsAustin CollegeShermanUSA

Personalised recommendations