Atomic Force Microscopy Imaging of Single Ion Impacts on Mica
The electron affinity and potential energy that is associated with highly charged ions may be used to create nanometer scale damage sites on the surface of insulating materials. We have used atomic force microscopy to image the surface damage caused by single ion impacts. Freshly cleaved mica was irradiated by low energy Xe44+ ions at normal incidence. Impact sites are typically circular protrusions 20 nm in diameter and 0.3 nm in height. Lateral force microscopy shows the damage sites to have increased friction relative to the surrounding undisturbed crystal.
KeywordsGraphite Surface Damage Site Contact Mode Atomic Force Microscope Lateral Force Microscopy Mode Atomic Force Microscope Image
Unable to display preview. Download preview PDF.
- 1.E. S. Parilis, L. M. Kishinevsky, N. Yu. Turacv, B. E. Baklitzky, F. F. Umarov, V. K.Verleger, S. L. Nizhnaya, and 1. S. Bitensky, Atomic Collisions on Solid Surfaces, North Holland, Amsterdam, 539 (1993).Google Scholar
- 4.H. Feil, H. J. W. Anadtliet, M.-H. Tsai, J. D. Dow and 1. S. T. Tsong, Random and ordered defects on ion-bombarded Si(100)-(2x1) surfaces, Phys. Rev. Lett. 69: 3076–3079 (1992).Google Scholar
- 9.R. Coratger, A. Claverie, A. Chahboun, V. Landry, F. Ajustron, and J. Beauvillian, Effects of ion mass and energy on the damage induced by an ion beam on graphite surfaces: a scanning tunneling microscopy study, SurfaceScience 262: 208–218 (1992).Google Scholar
- 10.S. Bouflàrd, J. Cousty, Y. Pennec, and F. Thilbaudau, STM and AFM observations of latent tracks, Radiat. Eff. and Defects in Solids 126: 225–228 (1993).Google Scholar
- 13.Digital Instruments, Santa Barbara, CAGoogle Scholar
- 14.T. Hagen, J. Ackerman, N. Angell, S. Grafstrom, M. Neitzert, R. Neumann, C. Trautmann and J. Vetter, Friction studies of heavy-ion irradiated mica on a sub-µni scale using a scanning force microscope, OSI Scientific Report 1992, 303 (1992).Google Scholar