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Photon Tunneling Microscopy of Polymers

  • John M. Guerra
  • Mohan Srinivasarao
  • Alex Hsieh

Abstract

The photon tunneling microscope (PTM) can image polymer surface morphology with vertical resolution below a nanometer and lateral resolution of 0.10 μm. PTM produces visual, whole-field tunneling images as well as real-time high resolution three-dimensional images with continuous interactive perspective, ready for stereopsis. In addition, surfaces are imaged without metallization, shadowing, vacuum, electrons, or scanning probes. A brief review of the theory, instrumentation, and features of photon tunneling microscopy is presented. Applications of PTM to such diverse polymeric surfaces as polystyrene sphere structures, single polyethylene crystals, silicon dioxide thin films on polycarbonate, and a real-time dewetting study of polystyrene at the glass transition temperature are presented and briefly discussed.

Keywords

Scanning Probe Lateral Resolution Evanescent Wave Polystyrene Sphere Optical Barrier 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

  1. 1.
    J.M. Guerra, Photon tunneling microscopy, Appl. Opt. 29: 3741–3752 (1990).CrossRefGoogle Scholar
  2. 2.
    J.M. Guerra and W.T. Plummer, Optical proximity imaging method and apparatus, U.S. Patent 4,681,451 (21 July 1987 ).Google Scholar
  3. 3.
    J.M. Guerra, Photon tunneling microscopy, Proc. Soc. Photo-Opt. Instrum. Eng. 1009: 254263 (1988).Google Scholar
  4. 4.
    C.W. McCutchen, Optical systems for observing surface topography by frustrated total internal reflection and by interference, Rev. Sci. Instrum. 35: 1340–1345 (1964).CrossRefGoogle Scholar
  5. 5.
    J. Strong, “Concepts of Classical Optics,” Freeman, San Francisco, 124–126, 516–518 (1958).Google Scholar
  6. 6.
    S.G. Lipson, and H. Lipson, “Optical Physics,” Cambridge University Press, London, 79–109, 282285 (1969)Google Scholar
  7. 7.
    D.D. Coon, Counting photons in the optical barrier penetration experiment, Am. J. Phys. 34: 240243 (1966).Google Scholar
  8. 8.
    S. Zhu, Frustrated total internal reflection: a demonstration and review, Am. J. Phys. 54(7): 601607 (1986).Google Scholar
  9. 9.
    A. Keller, Regular rotation of growth terraces in polymer single crystals, Kolloid-Zeitschrift & Zeitschrift Für Polymere, Band 219, Heft 2: Seite 118–131 (1967).Google Scholar
  10. 10.
    P. Sullivan and B. Wunderlich, The interference microscopy of crystalline linear high polymers, SPE Transactions, 4: 2, 2–8 (1964).Google Scholar
  11. 11.
    F. Lin, N.V. Gvozdic, and D.J. Meier, Application Note No. 2–1092–001, Topometrix Corp., Santa Clara CA (Oct., 1992 ).Google Scholar

Copyright information

© Springer Science+Business Media New York 1994

Authors and Affiliations

  • John M. Guerra
    • 1
  • Mohan Srinivasarao
    • 2
  • Alex Hsieh
    • 3
  1. 1.Optical Engineering DepartmentPolaroid CorporationCambridgeUSA
  2. 2.University of Massachusetts Polymer Science DepartmentAmherstUSA
  3. 3.Materials Technology LaboratoryU. S. Army Laboratory CommandWatertownUSA

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