Atomic Force Microscopy Studies of Ultra-Thin Films of Cadmium Phosphide Nanoclusters on Mica
In this study we demonstrate the use of contact AFM to determine the size of semiconductor nanoclusters with diameters of order of 30 A. This goal is achieved by taking advantage of tip-induced sample modifications, which are usually the major obstacle in AFM imaging. Nanocluster size is deduced from the depth of holes micromachined with a tip in monolayers and from row spacings in 2-D oriented arrays of nanoclusters produced by prolonged scanning. Ease and accuracy of micromachining of nanocluster films point to their potential applications in nanotechnology.
KeywordsAtomic Force Microscopy Study Particle Film Film Disruption Nanocluster Size Oriented Pattern
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