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Dimensional Measurements Analysis of a Silicon Half Ladeer Microvertex Detector

  • G. Ambrosi
  • T. Angelescu
  • R. Battiston
  • M. Biasini
  • D. Dascalu
  • C. Gingu
  • M. Ionica
  • Al. Mihul
  • M. Pauluzzi
  • V. Postolache

Abstract

The Silicon Microvertex Detector (SMD) was designed to upgrade the central tracking capability of the Luminosity 3 (L3) experiment at the CERN LEP storage ring (Large Electron Positron)1. The SMD allows a two-dimensional measurement of charged particle tracks over the polar angle region 22°<θ<158° and over the full azimuthal region, improving the L3 impact parameter resolution, momentum and Z coordinate measurements. High performance vertex reconstruction depends, among other parameters, on the accurate knowledge of the detector position in space and on its stability in time. A full description of SMD design parameters can be found in2. Each technological operation involved in SMD manufacturing process2,3 requires careful monitor of multiple geometrical parameters, at micron level, for each constitutive part as well as for the whole detector45.

Keywords

Wire Bonding Thermal Deviation Aluminium Nitride Micron Level Large Electron Positron 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer Science+Business Media New York 1997

Authors and Affiliations

  • G. Ambrosi
    • 3
  • T. Angelescu
    • 2
  • R. Battiston
    • 3
  • M. Biasini
    • 3
  • D. Dascalu
    • 1
  • C. Gingu
    • 1
  • M. Ionica
    • 1
  • Al. Mihul
    • 2
  • M. Pauluzzi
    • 3
  • V. Postolache
    • 4
  1. 1.Institute of MicrotechnologyBucharestRomania
  2. 2.Faculty of PhysicsUniversity of BucharestMagureleRomania
  3. 3.Dipartimento di FisicaUniversity of PerugiaPerugiaItaly
  4. 4.Microelectronica, BucharestBucharestRomania

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