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A High Resolution Reflectometer for Measuring Dynamic Strain in a Single Mode Optical Fibre

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Book cover Applications of Photonic Technology 2

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Abstract

A high resolution, pulsed time-of-flight (TOF) reflectometer for measuring length and dynamic strain in a single mode optical fibre is reported. The object of the paper is to discuss the measurement principle and to present the results of some practical experiments, including a pull test on an OPGW cable and an elongation test on a standard telecommunication fibre with a dual-acrylate coating. Applications in the field of optical fibre-based strain sensing are also briefly reviewed.

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References

  1. J. Kostamovaara, K. Määttä, M. Koskinen and R. Myllylä, Pulsed laser radars with high-modulation-frequency in industrial applications, in: Proceeding of SPlE vol. 1633 Laser Radar VII, SPIE, Los Angeles (1988).

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Author information

Authors and Affiliations

  1. Department of Electrical Engineering, Electronics Laboratory, University of Oulu, Linnanmaa, Fin 90570, Oulu, Finland

    Veijo Lyöri, Kari Määttä, Seppo Nissilä & Harri Kopola

  2. Imatran Voima Oy, Research and Development Division, 01019 IVO, Finland

    Marja Englund & Asko Mitrunen

Authors
  1. Veijo Lyöri
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  2. Kari Määttä
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  3. Seppo Nissilä
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  4. Harri Kopola
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  5. Marja Englund
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  6. Asko Mitrunen
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Editor information

Editors and Affiliations

  1. A.U.G. Signals Ltd., Toronto, Ontario, Canada

    George A. Lampropoulos

  2. Université Laval, Quebec City, Quebec, Canada

    Roger A. Lessard

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© 1997 Springer Science+Business Media New York

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Lyöri, V., Määttä, K., Nissilä, S., Kopola, H., Englund, M., Mitrunen, A. (1997). A High Resolution Reflectometer for Measuring Dynamic Strain in a Single Mode Optical Fibre. In: Lampropoulos, G.A., Lessard, R.A. (eds) Applications of Photonic Technology 2. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-9250-8_113

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  • DOI: https://doi.org/10.1007/978-1-4757-9250-8_113

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4757-9252-2

  • Online ISBN: 978-1-4757-9250-8

  • eBook Packages: Springer Book Archive

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