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Microscanning Setup for Focal Plane Arrays

  • Jean Fortin
  • Paul Chevrette
  • Robert Plante

Abstract

Infrared focal plane arrays (FPA) are becoming widely used in the field of thermal imaging. As compared to older 1-detector scanning systems, these sensors showed tremendous improvement. However, FPAs have a major drawback over scanning systems as, for a given instantaneous field of view (IFOV), they can only reproduce half the frequencies scanning systems do. This is due to the Nyquist theorem which stipulates that at least two samples must be taken for each cycle1 in the image.

Keywords

Modulation Transfer Function Scanning System Focal Plane Array Instantaneous Field Pixel Pitch 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

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    D.J. Bradley and P.N.J. Dennis, Sampling effects in CdHgTe focal plane arrays, SPIE on Infrared Technology and Applications. 590: 53 (1991).Google Scholar
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    W.L. Woolfe and G.J. Zissis, “The Infrared Handbook”, Infrared information analysis, center, Washington DC, (Revised Edition 1985).Google Scholar
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    W. Schuberth, Characterization of the spatial resolution of focal plane arrays, in: “Proposal for the RSG.16 subgroup on focal plane arrays”, Forschungsinstitut für optik, Tübingen (1991).Google Scholar
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    F.P. Bloomel and P.N.J. Dennis, The effects of microscan operation on staring infrared sensor imagery, SPIE on Infrared Technology XVII. 1540: 653 (1991).CrossRefGoogle Scholar
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    G. Jacquemod, C. Odet and R. Goutte, “Superresolution technique applied to CCD sensors”, Proc. EUSIPCO-88, 2: 847 (1988).Google Scholar

Copyright information

© Springer Science+Business Media New York 1995

Authors and Affiliations

  • Jean Fortin
    • 1
  • Paul Chevrette
    • 1
  • Robert Plante
    • 1
  1. 1.Electro-optics DivisionDefence Research Establishment ValcartierCourceletteCanada

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