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An Experimental Apparatus for the Characterization of Thick-Film Optical Waveguides

  • F. Docchio
  • G. Sansoni
  • D. Marioli
  • A. Taroni
  • M. Perini
  • S. Corini

Abstract

Optical sensors are largely used in modern metrology and quality control in manufacturing. Generally these sensors are based on the use of (i) discrete optical components, (ii) optical fibres and (iii) integrated optical devices. Main limitations of these sensors are the cost of bulk optics and the difficulties in the manufacturing of integrated optics.

Keywords

Thick Film Optical Sensor Optical Waveguide Polarization Property Scattered Light Intensity 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

  1. 1.
    R.B. South and H. McDonough, Thick film optical waveguides, in: “Proc. of the 5th European Hybrid Microelectronics Conference,” Stresa (1985).Google Scholar
  2. 2.
    L. Guerra. “Componenti a Film Spesso: — Caratterizzazione Ottica e Realizzazione di Guide,” Dissertation Thesis, University of Modena (1987).Google Scholar
  3. 3.
    H. Nishihara, M. Haruna, and T. Suhara. “Optical Integrated Circuits,” McGraw-Hill, New York (1985).Google Scholar
  4. 4.
    F. Docchio, D. Marioli, G. Sansoni, and A. Taroni, Measurement of attenuation losses and of light distribution in thick film optical waveguides, accepted for publication in Sensors and Materials (1994).Google Scholar

Copyright information

© Springer Science+Business Media New York 1995

Authors and Affiliations

  • F. Docchio
    • 1
  • G. Sansoni
    • 1
  • D. Marioli
    • 1
  • A. Taroni
    • 1
  • M. Perini
    • 1
  • S. Corini
    • 1
  1. 1.Dipartimento di Elettronica per l’Automazione, Facoltà di IngegneriaUniversità degli Studi di BresciaBresciaItaly

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