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Deconvolved Ionization Probabilities for Strong Field Ionization of Xenon

  • Mark A. Walker
  • Peter Hansch
  • Linn D. Van Woerkom

Abstract

Using a novel experimental technique, Intensity Selective Scanning1.2, we have collected time-of-flight mass spectra of ions produced by strong field laser ionization. The hallmark of this technique is that it eliminates a persistent problem inherent in traditional experiments: the complex spatial distribution of intensities present in the ionizing pulse. As a consequence, it becomes possible to extract ionization yields as a function of intensity directly from the experimental data, removing the complication of deducing them from a spatially averaged signal. We will resent results for xenon ionized by laser pulses at intensities ranging from 1013 to 4x104 W/cm2.

Keywords

Photoelectron Spectrum Saturation Intensity Inversion Procedure Double Ionization Ionization Data 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

  1. 1.
    P. Hansch and L. D. Van Woerkom, Opt. Lett. 21, 1286 (1996)ADSCrossRefGoogle Scholar
  2. 2.
    P.Hansch, M. A. Walker and L. D. Van Woerkom, Phys. Rev. A 54, R2559 (1996)CrossRefGoogle Scholar

Copyright information

© Springer Science+Business Media New York 1998

Authors and Affiliations

  • Mark A. Walker
    • 1
  • Peter Hansch
    • 1
  • Linn D. Van Woerkom
    • 1
  1. 1.Department of PhysicsThe Ohio State UniversityColumbusUSA

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