Performance Characteristics of Silicon Diode Cryogenic Temperature Sensors
Performance characteristics with current technology for silicon diode temperature sensors are outlined and data presented which illustrates the commonly encountered problems associated with their use. The packaging which resulted in a wide range, hermetically packaged diode sensor is presented. Data on the matching characteristics and reproducibility of the sensor are discussed. In addition, a means of enhancing accuracy over the temperature range from 50K to 335K to better than 0.15K with the aid of a two point calibration is illustrated.
KeywordsTemperature Sensor Liquid Helium Calibration Point Liquid Helium Temperature Thermal Design
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- 3.J. M. Swartz and D. L. Swartz, Cryogenic Temperature Sensors, Instrum. Tech., 33 (1974).Google Scholar
- 6.R. W. Treharne and J. A. Riley, A Linear Response Diode Temperature Sensor, Instrum. Tech., 59 (1978).Google Scholar
- 8.J. Sondericker, Production and Use of High Grade Silicon Diode Temperature Sensors, in: “Advances in Cryogenic Engineering”, Vol. 27, R. W. Fast, ed., Plenum Press, New York (1981), p. 1163.Google Scholar
- 9.M. G. Rao, Semiconductor Junctions as Cryogenic Temperature Sensors, in: “Temperature, Its Measurement and Control in Science and Industry”, American Institute of Physics, New York (1982), p. 1205.Google Scholar
- 11.M. G. Rao and R. G. Scurlock, Recent Advances in Si and Ge Diode Thermometers. in: “Proceedings of the Tenth International Cryogenic Engineering Conference”, H. Collen, P. Berglund and M. Krusius, Ed., Butterworth, Guildford (1986), p. 617.Google Scholar
- 12.J. K. Krause and P. R. Swinehart, Reliable Wide Range Diode Thermometry, in: “Advances in Cryogenic Engineering”, Vol. 31, R. W. Fast, Ed., Plenum Press, New York (1985), p. 1247.Google Scholar
- 13.R. M. Igra, M. G. Rao and R. G. Scurlock, Thermometric Characteristics of the Improved Miniature Si Diodes. in: “Proceedings of the Eleventh International Cryogenic Engineering Conference”, G. Klipping and T. Klipping, Ed., Butterworth, Guildford (1986), p. 617.Google Scholar
- 14.J. K. Krause and B. C. Dodrill, Measurement System Induced Errors in Diode Thermometry, Rev. Scien. Instrum., 4:57 (1986). This paper gives a thorough discussion of potential errors associated with induced currents picked up through the leads to the diode sensor.Google Scholar
- 15.The hermetic diode sensor is commercially available as the DT-470 series diode sensor from Lake Shore Cryotronics, Inc.Google Scholar
- 16.J. K. Krause and P. R. Swinehart, Demystifying Cryogenic Temperature Sensors, Photonics Spectra, (1985).Google Scholar
- 17.A. C. Rose-Innes, “Low Temperature Laboratory Techniques”, The English University Press, Great Britain, (1973).Google Scholar
- 18.G. K. White, “Experimental Techniques in Low Temperature Physics”, Clarendon, Oxford, (1979).Google Scholar