Abstract
YBa2Cu3Oy (YBCO) junctions were fabricated across the step-edge on MgO (001) substrates. The line of the step-edge made an angle, a, of 90°, 45°, or 22.5°° with the crystal a-axis. The step heights were 120–350 nm. YBCO films were grown onto the MgO (001) (the step-edge substrate) using an off axis rf magnetron sputtering system. The YBCO films were patterned to a 10 jam narrow strip crossing the edges. The critical current densities of YBCO junctions at T/Tc = 0.9 varied from 103 — 105 A/cm2 depending on ratio of the step height to the film thickness. The I-V curves under microwave irradiation showed Shapiro steps, indicating weak-link behavior. Using the step-edge junctions, we fabricated and characterized junctions and SQUIDs.
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© 1996 Springer Science+Business Media New York
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Yang, H.C., Lu, J.H., Young, B., Horng, H.E. (1996). Critical Current Characteristics of Step-Edge YBa2Cu3Oy Weak Links. In: Summers, L.T. (eds) Advances in Cryogenic Engineering Materials . Advances in Cryogenic Engineering Materials , vol 42. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-9059-7_86
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DOI: https://doi.org/10.1007/978-1-4757-9059-7_86
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