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Investigation of Microscopic Strain by X-Ray Diffraction in Nb3Sn Tape Conductors Subjected to Compressive and Tensile Strains

  • Bennie ten Haken
  • Arno Godeke
  • Herman H. J. ten Kate
Part of the Advances in Cryogenic Engineering Materials book series (ACRE, volume 42)

Abstract

A new experimental set-up is developed in which the lattice deformation of a thin layer can be investigated by X-ray diffraction. The investigated layer is cooled to low temperatures below 20 K and can be deformed by means of a bending spring. This set-up is used to study the lattice deformation in a polycrystalline Nb3Sn layer as a function of the macroscopically applied strain. This comparison is made at a low temperature near the critical temperature and below the cubic to tetragonal transition temperature of Nb3Sn. A very good correlation is found between the lattice deformation and the applied strain in a Nb3Sn layer. These experimental results show that the compressive and tensile strain applied by bending the substrate are well transmitted to the Nb3Sn grains inside the polycrystalline layer of a tape sample. Also it enables a direct comparison between the critical properties of a deformed Nb3Sn layer and the lattice parameters.

Keywords

Critical Property Applied Strain Lattice Deformation Macroscopic Strain Strain Dependence 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer Science+Business Media New York 1996

Authors and Affiliations

  • Bennie ten Haken
    • 1
  • Arno Godeke
    • 1
  • Herman H. J. ten Kate
    • 1
  1. 1.Low Temperature DivisionUniversity of TwenteAE Enschedethe Netherlands

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