Investigation of Microscopic Strain by X-Ray Diffraction in Nb3Sn Tape Conductors Subjected to Compressive and Tensile Strains
A new experimental set-up is developed in which the lattice deformation of a thin layer can be investigated by X-ray diffraction. The investigated layer is cooled to low temperatures below 20 K and can be deformed by means of a bending spring. This set-up is used to study the lattice deformation in a polycrystalline Nb3Sn layer as a function of the macroscopically applied strain. This comparison is made at a low temperature near the critical temperature and below the cubic to tetragonal transition temperature of Nb3Sn. A very good correlation is found between the lattice deformation and the applied strain in a Nb3Sn layer. These experimental results show that the compressive and tensile strain applied by bending the substrate are well transmitted to the Nb3Sn grains inside the polycrystalline layer of a tape sample. Also it enables a direct comparison between the critical properties of a deformed Nb3Sn layer and the lattice parameters.
KeywordsCritical Property Applied Strain Lattice Deformation Macroscopic Strain Strain Dependence
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