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Biaxially Aligned High Jc YBCO Tapes on YSZ Buffer Layers Deposited By IBAD Method

  • M. Hosaka
  • Y. Iijima
  • N. Sadakata
  • T. Saitoh
  • O. Kohno
  • K. Takeda
Part of the Advances in Cryogenic Engineering book series (ACRE, volume 44)

Abstract

High Jc YBCO thin film tapes were continuously fabricated on flexible Ni-based alloy. Biaxially aligned YBCO films were deposited by PLD on textured YSZ buffer layers formed by using IBAD (ion-beam-assisted deposition). For the short sample, Jc value of 1.13×106A/cm22 (77K, OT) was obtained and 1.1×105A/cm2 was maintained at 5T (Bic) with measured length of 1cm. For the long sample, Jc value of 2.1×105A/cm2, and Ic value of 20.8A were obtained (77K, OT) with measured length of 0.7m. Longitudinal uniformity of the long sample was excellent. Self-field a.c. losses of 0.25m length tapes were measured by a.c. four probe method. The results agreed with Norris’ prediction of low a.c. losses for thin strip conductors.

Keywords

YBCO Film Short Sample Hysteresis Loss Strip Conductor YBCO Layer 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer Science+Business Media New York 1998

Authors and Affiliations

  • M. Hosaka
    • 1
  • Y. Iijima
    • 1
  • N. Sadakata
    • 1
  • T. Saitoh
    • 1
  • O. Kohno
    • 1
  • K. Takeda
    • 2
  1. 1.Tokyo 135Japan
  2. 2.Osaka 530Japan

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