Tests for p-port SRAMs

  • Said Hamdioui
Part of the Frontiers in Electronic Testing book series (FRET, volume 26)


Chapter 8 introduced realistic fault models for p-port (pP) memories. They have been divided into p classes: single-port faults (1PFs), two-port faults (2PFs), ..., p-port faults (pPFs). Tests for 1PFs and 2PFs have been addressed in Chapter 6; while tests for pPFs (p > 2) have to be established.


Test Strategy Simultaneous Operation Test Length Fault Coverage Read Operation 


Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

Copyright information

© Springer Science+Business Media New York 2004

Authors and Affiliations

  • Said Hamdioui
    • 1
  1. 1.Delft University of TechnologyThe Netherlands

Personalised recommendations