Abstract
A principal motivation for the investigation\of squeezed states of light has been the potential that such states offer for the improvement of the precision of optical measurements beyond the limit set by the zero-point or vacuum fluctuations of the electromagnetic field. In the past two years, this expectation has been heightened by the successful generation of squeezed states of light by several groups working with a variety of physical systems (1). If we set aside for the moment the numerous scientific and technological questions associated with the optimization of the squeezing produced in these initial experiments, it is an exciting prospect to attempt to employ these sources to implement the various measurement schemes with squeezed light that have been discussed in the theoretical literature for many years.
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References
Squeezed States of the Electromagnetic Field“, Feature Issue of J. Opt. Soc. Am. B4 (October, 1987).
C. M. Caves, Phys. Rev. D23, 1693 (1981).
L. A. Wu, H. J. Kimble, J. L. Hall, and H. Wu, Phys. Rev. Lett. 57, 2520 (1986) .
Min Xiao, L. A. Wu, and H. J. Kimble, Phys. Rev. Lett. 59 2781(1987).
P. Grangier, R. E. Slusher, B. Yurke, A. LaPorta, Phys. Rev. Lett. 59, 2566 (1987).
Min Xiao, L. A. Wu, and H. J. Kimble, Optics Lett. 13 (June,1988).
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© 1989 Springer Science+Business Media New York
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Kimble, H.J. (1989). Quantum Fluctuations in Optical Measurements. In: Tombesi, P., Pike, E.R. (eds) Squeezed and Nonclassical Light. NATO ASI Series, vol 190. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-6574-8_4
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DOI: https://doi.org/10.1007/978-1-4757-6574-8_4
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