Analysis and Measurement of Crosstalk-Induced Delay Errors in Integrated Circuits
Measurements are presented of the effect that line coupling produces on the transition delay of a signal when a signal commutes simultaneously in an adjacent line. A specific test circuit for the measurements has been used, implemented with an ASIC in 1.2 µm technology.
KeywordsClock Period Spurious Signal Coupling Capacitance Transition Delay Delay Error
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