Experimental techniques

  • Yu. G. Naidyuk
  • I. K. Yanson
Part of the Springer Series in Solid-State Sciences book series (SSSOL, volume 145)


Different types of the point contacts have been developed during elaboration of PCS method. The pioneering measurements were carried out by Yanson (see also Section 2.2) at the beginning of the 1970s exploiting thin film junctions. Here two evaporated in-sequence metallic films (the first one being oxidized before evaporating of the next one) were electrically isolated by oxides. The oxide layer on a metal, as a rule, is a few nanometers thick and serves as a good and strong dielectric. This structure is called a sandwich-like tunnel junction, and it is widely used as a tool by physical researches (see Section 2.2). If the oxidation is strong, the dielectric layer will be thick and the tunneling current negligibly small. By reducing of oxidation time, the appearance of “holes” in the oxide becomes possible; i. e., the conductivity between metallic films is not stipulated by the tunneling but by the current flowing through the metallic shorts. Such contacts have naturally to be rejected as far as they are not suitable for the tunneling investigations.


Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.


  1. Bobrov N. L., Rybaltchenko L. F., Yanson I. K. and Fisun V. V. (1987) Sov. J. Low Temp. Phys. 13 344.Google Scholar
  2. Chubov P. N., Yanson I. K. and Akimenko A. I. (1982) Sov. J. Low Temp. Phys. 8 32.Google Scholar
  3. Duif A. M. (1983) Doctoraalscriptie, Nijmegen. (unpublished )Google Scholar
  4. Goll G. (1993) Ph. D. Thesis, Karlsruhe. (unpublished )Google Scholar
  5. Gloos K. and Anders F. B. (1999) J. Low Temp. Phys. 116 21.ADSCrossRefGoogle Scholar
  6. Gloos K., Anders F. B., Buschinger B., Geibel C., Heuser K., Järling F., Kim J. S., Klemens R., Müller-Reisener., Schank C. and Stewart G. R. (1996) J. Low Temp. Phys. 105 37.ADSCrossRefGoogle Scholar
  7. Heil J., de Wilde Y., Jansen A. G. M. and Wyder P. (1993) Rev. Sci. In-strum. 64 1347.ADSCrossRefGoogle Scholar
  8. Jansen A. G. M., Mueller F. M. and Wyder P. (1977) Phys. Rev. 16 1325. Lambe J. and Jacklevic R. C. (1968) Phys. Rev. 165 821.Google Scholar
  9. Klein J., Leger A., Belin M. and Defourneau D. (1973) Phys. Rev. B 7 2336. Moreland J. and Ekin J. W. (1985) J. Appl. Phys. 58 3888.Google Scholar
  10. Muller C. J., van Ruitenbeek J. M. and de Jongh L. J. (1992) Physica C 191 485.ADSCrossRefGoogle Scholar
  11. Rails K. S., Buhrman R A. and Tiberio R. C. (1989) Appl. Phys. Lett 55 2459.ADSCrossRefGoogle Scholar
  12. Wolf E. L. (1985) Principles of Electron Tunneling Spectroscopy Oxford University Press, Inc. New York.Google Scholar

Copyright information

© Springer Science+Business Media New York 2005

Authors and Affiliations

  • Yu. G. Naidyuk
    • 1
  • I. K. Yanson
    • 1
  1. 1.B. Verkin Institute for Low Temperature Physics and EngineeringNational Academy of Sciences of UkraineKharkivUkraine

Personalised recommendations