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Abstract

Convergent beam electron diffraction (CBD) is a technique with a long history of gradual development which has recently become widely available through the development of commercial TEM/STEM electron microscopes. The technique was discovered by KOSSELL and MOLLENSTEDT (1939) who obtained some quite remarkably good results when one realizes that the size of focussed probe they were working with was comparatively large. Most specimens are so irregular that there would be considerably thickness variation within such areas producing a thickness average of the information. Further, few specimens are so flat that some important angular average will not occur over such areas. Thickness and orientation are two crucial parameters of electron diffraction and it is essential to eliminate their variation within the illuminated volume if meaningful results are to be obtained.

Keywords

None None Shadow Image Convergent Beam Electron Diffraction Kikuchi Line Condenser Lens 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer Science+Business Media New York 1979

Authors and Affiliations

  • J. W. Steeds
    • 1
  1. 1.University of BristolBristolEngland

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