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Stem Imaging of Crystals and Defects

  • C. J. Humphreys

Abstract

Crystals are like people: it is the defects in them which tend to make them interesting! This chapter describes the use of STEM imaging for the structural characterization of crystalline materials, perfect and imperfect. The object of the chapter is to describe basic principles as clearly as possible, using a minimum of mathematics.

Keywords

Incident Beam Beam Divergence Chromatic Aberration Convergent Beam Electron Diffraction Entrance Surface 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer Science+Business Media New York 1979

Authors and Affiliations

  • C. J. Humphreys
    • 1
  1. 1.Department of PhysicsArizona State UniversityTempeUSA

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