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Part of the book series: The Springer International Series in Engineering and Computer Science ((SECS,volume 742))

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Abstract

To verify the different specifications of converters and converter systems it is important to set up test facilities and structures and to agree unanimously on the test procedures. In general, static performance tests can be performed by using digital voltmeters which can be a part of an Automatic Test Equipment set (ATE). Dynamic tests, especially in the case of high-dynamic-range tests, require special equipment. Furthermore, these dynamic tests are generally more difficult to standardize and consume more test time (see [35, 36, 16, 17]). Up until now dynamic test results have been listed very briefly in specification sheets. In this chapter we will determine test configurations and test procedures in order to arrive at a unanimous qualification of converters.

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© 2003 Springer Science+Business Media New York

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van de Plassche, R. (2003). Testing of D/A and A/D converters. In: CMOS Integrated Analog-to-Digital and Digital-to-Analog Converters. The Springer International Series in Engineering and Computer Science, vol 742. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-3768-4_13

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  • DOI: https://doi.org/10.1007/978-1-4757-3768-4_13

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4419-5367-4

  • Online ISBN: 978-1-4757-3768-4

  • eBook Packages: Springer Book Archive

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