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Automated Electron Backscatter Diffraction: Present State and Prospects

  • Robert A. Schwarzer

Abstract

Electron backscatter diffraction (EBSD), or more precisely backscatter Kikuchi diffraction (BKD), in the SEM enables individual grain orientations, local texture and point-to-point orientation correlations to be determined routinely on bulk surfaces of polycrystalline materials. The technique has found rapid acceptance in materials science within the last few years (Randle, 1992; Schwarzer, 1997a) due to the wide availability of SEMs, the ease of sample preparation from the bulk, and the access to complementary information about the microstructure on a submicron scale. The combination of several easy-to-use techniques makes the SEM a powerful and almost universal analytical instrument in the hands of the physical metallurgist as well as the earth scientist. From the same specimen area, surface configuration and morphology of micro structure are perceived in great detail by the relief and orientation contrast in secondary and backscatter electron images, element distributions are accessed by EDS or cathodoluminescence analysis, and the orientations of single grains and phases can now be determined, as a complement, by EBSD.

Keywords

Grain Orientation Orientation Distribution Function Phosphor Screen Pattern Quality Material Science Forum 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer Science+Business Media New York 2000

Authors and Affiliations

  • Robert A. Schwarzer
    • 1
  1. 1.Physikalisches Institut - AG TexturTechnische Universität ClausthalClausthal-ZellerfeldGermany

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