Measuring Strains Using Electron Backscatter Diffraction
The electron backscatter diffraction (EBSD) technique has undergone significant development in recent years. The technique is most widely used for crystal orientation measurement, however, it also provides a powerful tool for phase discrimination (identification) and strain analysis. This chapter reviews the application of EBSD to the analysis of local strains (plastic and elastic) in materials.
KeywordsZone Axis Strain Sensitivity Electron Backscatter Diffraction Tetragonal Distortion Pattern Quality
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