Abstract
The electron backscatter diffraction (EBSD) technique has undergone significant development in recent years. The technique is most widely used for crystal orientation measurement, however, it also provides a powerful tool for phase discrimination (identification) and strain analysis. This chapter reviews the application of EBSD to the analysis of local strains (plastic and elastic) in materials.
This is a preview of subscription content, log in via an institution to check access.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
Reference
Bowen, D.K., Tanner, B.K., 1995, A method for the accurate comparison of lattice parameters, J. Appl. Cryst. 28:753.
Davidson, D.L., 1984, Uses of electron channelling in studying material deformation. Int. Metals Rev. 29:75.
Davidson, D.L., 1991, Measurement of microdisplacements by machine vision photogrammetry (DISMAP), Rev. Sci. Instrum. 62:1270.
Dietrich, D., Bugiel, E., Osten, HJ., and Zaumseil, P., 1993, Raman investigations of elastic strain relief in Si1_xGex layers on patterned silicon substrate. J. Appl. Phys. 74: 7223.
Driver, J.H., Juul Jensen, D., and Hansen, N., 1994, Large strain deformation structures in Al single crystals with rolling texture orientations, Acta Metall. 42:3105.
Harker, A.H., Pinardi, K., Jain, S.C., Atkinson, A., and Bullough, R., 1995, Two-dimensional finite-element calculation of stress and strain in a stripe epilayer and substrate. Phil. Mag. A. 71:871.
Kinaev, N.N., Cousens, D.R., and Atrens, A., 1999, The crack tip strain field of AISI 4340: Part I: Measurement technique, J. Mater. Sci. 34:4909.
Kozubowski, J.A., Keller, R.R., and Gerberich, W.W., 1991, Effects of tetragonal distortion in thin epitaxic films on electron channelling patterns in scanning electron microscopy J. Appl. Cryst. 24:102.
Krieger Lassen, N.C., Juul Jensen, D., and Conradsen, K., 1994. Automatic recognition of deformed and recrystallized regions of partly recrystallized samples using electron back scattering patterns. Mater. Sci. Forum. 157–162:149.
MacKenzie, R.A.D., 1987, Ph.D. thesis, University of Bristol.
Madden, M.C., and Hren, J.J., 1985, Fine structure in electron channelling, J. Microscopy. 139:1.
Maier, HJ., Keller, R.R., Renner, H., Mughrabi, H., and Preston, A, 1996, On the unique evaluation of local lattice parameters by convergent beam electron diffraction, Phil. Mag. A. 74:23.
Orsund, R., Hjelen, J., and Nes, E., 1989, Local lattice curvature and deformation heterogeneities in heavily deformed aluminium, Scripta Metall. 23:1193.
Powell, A.R., Kubiak, R.A., Whall, T.E., Parker, E.H.C., and Bowen, D.K., 1991, Residual strain and defect analysis in as grown and annealed SiGe layers. Mat. Res. Soc. Symp. Proc. 220:277.
Prior, D J., 1999, Problems in determining the misorientation axes for small angular misorientation, using electron backscatter diffraction in the SEM. J. Microsc. 195:217.
Quested, P.N., Henderson, P.J., and McLean, M., 1988, Observations of deformation and fracture heterogeneities in a nickel-base superalloy using electron back scattering patterns, Acta Metall. 36:2743.
Randle, V., Hansen, N., and Juul Jensen D., 1996, The deformation behaviour of grain boundary regions in polycrystalline aluminium, Phil. Mag. A. 73:265.
Stone, HJ., Withers, P.J., Holden, T.M., Roberts, S.M., Reed, R.C., 1999, Comparison of three different techniques for measuring the residual stresses in an electron beam-welded plate of WASPALOY, Metall Trans. A. 30:1797.
Troost, K.Z., van der Sluis, P., and Gravesteijn, D.J., 1993 Microscale elastic-strain determination by backscatter Kikuchi diffraction in the scanning electron microscope, Appl. Phys. Lett. 62:1110.
Tucker, A.M., Wilkinson, A.J., Henderson, M.B., Ubhi, H.S., and Martin, J.W., 2000, Measurement of fatigue crack plastic zones in fine-grained materials using electron backscatter diffraction. Material Science and Technology, in press.
Wert, J.A., Liu, Q., and Hansen, N., 1997, Dislocation boundary formation in a cold-rolled cube-oriented Al single crystal. Acta Metall. 45:2565.
Wilkinson, A.J., 1991, Ph.D. Thesis, University of Bristol.
Wilkinson, A.J., Relaxation modes of strained epilayers grown on patterned substrates, Proc. Int. Cong, on Electron Microsc. (Les Editions de Physique, Les Ulis 1994), 1:97.
Wilkinson, A.J., 1996, Measurement of elastic strains and small lattice rotations using electron back scatter diffraction. Ultramicroscopy. 62:237.
Wilkinson, A.J., 1997, Methods for determining elastic strains from electron back scatter diffraction and electron channelling patterns. Mater. Sei. Tech. 13:79.
Wilkinson, A J., and Dingley, D.J., 1991, Quantitative deformation studies using electron back scatter patterns, Acta Metall Mater. 39:3047.
Wilkinson, A.J., Measurement of small misorientations using electron back scatter diffraction. Proc. Electron Microscopy and Analysis Group Conf., Inst. Phys. Conf. Series. No. 161:115.
Yamaguchi, M., Tachikawa, M., Sugo, M., Kondo, S., and Itoh, Y., 1990, Analysis for dislocation density reduction in selective area grown GaAs films on Si substrates. Appl. Phys. Lett. 56:27.
Young, R. J., 1997, Analysis of composites using Raman and fluorescence microscopy — a review, J. Microsc. 185:199.
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2000 Springer Science+Business Media New York
About this chapter
Cite this chapter
Wilkinson, A.J. (2000). Measuring Strains Using Electron Backscatter Diffraction. In: Schwartz, A.J., Kumar, M., Adams, B.L. (eds) Electron Backscatter Diffraction in Materials Science. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-3205-4_19
Download citation
DOI: https://doi.org/10.1007/978-1-4757-3205-4_19
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4757-3207-8
Online ISBN: 978-1-4757-3205-4
eBook Packages: Springer Book Archive