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Measuring Strains Using Electron Backscatter Diffraction

  • Angus J. Wilkinson

Abstract

The electron backscatter diffraction (EBSD) technique has undergone significant development in recent years. The technique is most widely used for crystal orientation measurement, however, it also provides a powerful tool for phase discrimination (identification) and strain analysis. This chapter reviews the application of EBSD to the analysis of local strains (plastic and elastic) in materials.

Keywords

Zone Axis Strain Sensitivity Electron Backscatter Diffraction Tetragonal Distortion Pattern Quality 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer Science+Business Media New York 2000

Authors and Affiliations

  • Angus J. Wilkinson
    • 1
  1. 1.Department of MaterialsUniversity of OxfordOxfordUK

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