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Characterization of Deformed Microstructures

  • David P. Field
  • Hasso Weiland

Abstract

Over the past two decades or so, electron backscatter diffraction (EBSD) has become an increasingly important analytical technique in characterizing polycrystalline microstructures. As this tool was championed by the texture analysis community in the early stages of its application to materials research, characterization of deformed materials has been a significant fraction of the EBSD applications research published in the open literature. This chapter focuses on the application of EBSD to the characterization of deformed materials.

Keywords

Pole Figure Friction Stir Welding Misorientation Angle Dislocation Cell Orientation Image 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer Science+Business Media New York 2000

Authors and Affiliations

  • David P. Field
    • 1
  • Hasso Weiland
    • 2
  1. 1.TexSEM Laboratories (TSL)DraperUSA
  2. 2.Alcoa Technical CenterAlcoa CenterUSA

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