Structure-Properties Relations: EBSD-Based Material-Sensitive Design

  • Brent L. Adams
  • Ben Henrie
  • Larry Howell
  • Richard Balling


Automated EBSD, also known as Orientation Imaging Microscopy (OIM™) (Adams et al., 1993), provides data on those aspects of the internal structure of polycrystalline materials that are described by the idealized aggregate function G(x) (Bunge, 1998):
$$ G(x) = \left\{ {\phi (x),g(x)} \right\} $$
where Φ(x) and g(x) denote the crystal phase and orientation at position x within the material. G(x), it should be noted, does not directly describe the geometrical character of grain boundaries or interfaces, except in the sense that upon examining a finite neighborhood about any selected point, lying sufficiently close to an interface, from G(x) one can recover the five-parameter macroscopic description of the interface. (For simplicity, the discussion here will concern single-phase polycrystals where Φ(x) is constant.)


Slip System Yield Surface Orientation Distribution Function Critical Resolve Shear Stress Coincidence Site Lattice 
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Copyright information

© Springer Science+Business Media New York 2000

Authors and Affiliations

  • Brent L. Adams
    • 1
  • Ben Henrie
    • 1
  • Larry Howell
    • 1
  • Richard Balling
    • 2
  1. 1.Department of Mechanical EngineeringBrigham Young UniversityProvoUSA
  2. 2.Department of Civil and Environmental EngineeringBrigham Young UniversityProvoUSA

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