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Abstract

In the three articles that follow, manufacturers of commercial electron backscatter diffraction (EBSD) units describe aspects of their systems. These articles provide a snapshot of the state-of-the-art hardware and software capabilities at the beginning of the year 2000. However, things are changing very rapidly in this new and exciting field. EBSD is very important. It will revolutionize scanning electron microscopy for all applications that involve crystalline material. More than that, EBSD will have a major impact on other fields. Many characterization experiments that would have been done using other techniques will now be done, and done better, using EBSD on the scanning electron microscope (SEM).

Keywords

Potential Buyer Exciting Field Professional Programmer EBSD Pattern Software Capability 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Reference

  1. Eades, J.A., Choosing an electron backscattering pattern (EBSP) system, Microsc. Microanal. 5 (Suppl 2) 250–251 (1999)Google Scholar
  2. Reprinted in a slightly modified form in Microscopy Today (in press).Google Scholar

Copyright information

© Springer Science+Business Media New York 2000

Authors and Affiliations

  • Alwyn Eades
    • 1
  1. 1.Department of Materials Science and EngineeringLehigh UniversityBethlehemUSA

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