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Experimental measurements performed on a mixed-signal IC

  • Xavier Aragonès
  • José Luis González
  • Antonio Rubio
Chapter

Abstract

This chapter deals with experimental measurements performed on a mixed-signal test IC. These measurements allow comparison of noise performance of lightly and heavily doped wafers. The results obtained will also be used to verify the results obtained in previous chapters, particularly the ones to do with dominant coupling paths, and to validate the models used in chapter 4. Our aim is also to prove how prone circuits like A/D converters and RAM cells are to substrate noise. Some comparators commonly used by these circuits have been included in the IC (auto-zeroed, sense amplifier), and the drop in resolution produced by substrate noise will be measured.

Keywords

Supply Line Guard Ring Substrate Noise Sense Amplifier Noise Waveform 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

  1. [1]
    T. Blalack, B.A. Wooley, “The Effects of Switching Noise on an Oversampling A/D Converter”, Proc. IEEE International Solid-State Circuits Conference, pp 200–201, 1995.Google Scholar
  2. [2]
    J. Catrysse, “Measured Distortion of the Output-Waveform of an Integrated OPAMP Due to Substrate Noise”, IEEE Trans. Electromagnetic Compatibility, vol. 37, no. 2, pp. 310–312, May 1995.CrossRefGoogle Scholar
  3. [3]
    B.P. Brandt, B.A. Wooley, “A 50-MHz Multibit Sigma-Delta Modulator for 12-bit 2-MHz A/D Conversion”, IEEE J. Solid-State Circuits, vol. 26, no. 12, pp. 1746–1756, December 1991.CrossRefGoogle Scholar
  4. [4]
    J.W. Fattarusso, S. Kiriaki, M. de Wit, G. Warmar, “Self-Calibration Techniques for a Second-Order Multibit Sigma-Delta Modulator”, IEEE J. Solid-State Circuits, vol. 28, no. 12, pp. 1216–1223, December 1993.CrossRefGoogle Scholar
  5. [5]
    D.B. Ribner, R.D. Baertsch, S.L. Garverick, D.T. McGrath, J.E. Krisciunas, T. Fujii, “A ThirdOrder Multistage Sigma-Delta Modulator with Reduced Sensitivity to Nonidealities”, IEEE J. Solid-State Circuits, vol. 26, no. 12, pp. 1764–1774, December 1991.CrossRefGoogle Scholar
  6. [6]
    J. Eklund, R. Arvidson, “A Multiple Sampling, Single A/D Conversion Technique for I/Q Demodulation in CMOS”, IEEE J. Solid-State Circuits, vol. 31, no. 12, pp. 1987–1994, December 1996.CrossRefGoogle Scholar
  7. [7]
    Principles of CMOS VLSI Design: A Systems Perspective, 2nd edition, Neil H.E. Weste, Kamran Eshraghian, Addison-Wesley, 1992.Google Scholar
  8. [8]
    K. Makie-Fukuda, T. Anbo, T. Tsukada, T. Matsuura, M. Hotta, “Voltage-Comparator-Based Measurement of Equivalently Sampled Substrate Noise Waveforms in Mixed-Signal Integrated Circuits”, IEEE J. Solid-State Circuits, vol. 31, no. 5, pp. 726–731, May 1996.CrossRefGoogle Scholar
  9. [9]
    T. Tsuruda, M. Kobayashi, M. Tsukude, T. Yamagata, K. Arimoto, M. Yamada, “High-Speed/High Bandwidth Design Methodologies for On-Chip DRAM Core Multimedia System LSI’s”, IEEE J. Solid-State Circuits, vol. 32, no. 3, pp. 477–482, March 1997.CrossRefGoogle Scholar
  10. [10]
    X. Aragonès, F. Moll, M. Roca, A. Rubio, “Analysis and Modelling of Parasitic Substrate Coupling in CMOS Circuits”, IEE Proceedings-Circuits Devices & Systems, vol. 142, no. 5, pp. 307–312, October 1995.CrossRefGoogle Scholar
  11. [11]
    D.J. Allstot, S. Chee, S. Kiaei, M. Shrivastawa, “Folded Source-Coupled Logic vs. CMOS Static Logic for Low-Noise Mixed-Signal ICs”, IEEE Trans. Circuits and Systems I: Fundamental Theory and Applications, vol. 40, no. 9, pp. 553–563, September 1993.CrossRefGoogle Scholar
  12. [12]
    Influència de les Interconnexions en el Disseny Microelectrônic, Francesc Moll, PhD Thesis, DEEUPC, Barcelona, 1995.Google Scholar
  13. [13]
    P. Larsson, C. Svensson, “Measuring High-Bandwidth Signals in CMOS Circuits”, Electronics Letters, vol. 29, no. 20, pp. 1761–1762, 30th September 1993.CrossRefGoogle Scholar
  14. [14]
    K. Makie-Fukuda, T. Kikuchi, T. Matsuura, M. Hotta, “Measurement of Digital Noise in Mixed-Signal Integrated Circuits”, IEEE J. Solid-State Circuits, vol. 30, no. 2, pp. 87–92, February 1995.CrossRefGoogle Scholar

Copyright information

© Springer Science+Business Media New York 1999

Authors and Affiliations

  • Xavier Aragonès
    • 1
  • José Luis González
    • 1
  • Antonio Rubio
    • 1
  1. 1.Universitat Politècnica de Catalunya (UPC)Spain

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