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Recursive Learning

  • Wolfgang Kunz
  • Dominik Stoffel
Part of the Frontiers in Electronic Testing book series (FRET, volume 9)

Abstract

This chapter describes an algorithm for identifying all necessary assignments for single stuck-at fault detection. This is of central interest not only in test generation but also in logic synthesis and verification as will be developed in Chapters 5 and 6.

Keywords

Test Generation Recursion Level Recursion Depth Test Generation Algorithm Forward Implication 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer Science+Business Media Dordrecht 1997

Authors and Affiliations

  • Wolfgang Kunz
    • 1
  • Dominik Stoffel
    • 1
  1. 1.University of PotsdamGermany

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