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Introduction

  • Aad W. van der Vaart
  • Jon A. Wellner
Part of the Springer Series in Statistics book series (SSS)

Abstract

The empirical process methods and techniques developed in Part 2 have many applications in statistics. The present part illustrates this in some detail by applications ranging from M-estimation (limit theory and rates of convergence in infinite-dimensional applications), bootstrapping, permutation tests, tests of independence, the functional delta-method, and contiguity theory.

Keywords

Outer Probability Criterion Function Empirical Process Copula Function Total Variation Distance 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer Science+Business Media New York 1996

Authors and Affiliations

  • Aad W. van der Vaart
    • 1
  • Jon A. Wellner
    • 2
  1. 1.Department of Mathematics and Computer ScienceFree UniversityAmsterdamThe Netherlands
  2. 2.StatisticsUniversity of WashingtonSeattleUSA

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