Skip to main content

Uniformity and Metrization

  • Chapter
  • 10k Accesses

Part of the book series: Springer Series in Statistics ((SSS))

Abstract

In principle, weak convergence is the pointwise convergence of “operators” X α or L α on the space C b (D). However, there is automatically uniform convergence over certain subsets. These subsets can be fairly big: equicontinuity and boundedness suffice. On the other hand, there also exist small (countable) subsets such that pointwise convergence on such a subset is automatically uniform, and equivalent to pointwise convergence on the whole of C b (D), i.e. weak convergence. For separable D, it is even possible to pick such a countable subset that works for every X α , at the same time.

This is a preview of subscription content, log in via an institution.

Buying options

Chapter
USD   29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD   189.00
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD   249.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Learn about institutional subscriptions

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

Author information

Authors and Affiliations

Authors

Rights and permissions

Reprints and permissions

Copyright information

© 1996 Springer Science+Business Media New York

About this chapter

Cite this chapter

van der Vaart, A.W., Wellner, J.A. (1996). Uniformity and Metrization. In: Weak Convergence and Empirical Processes. Springer Series in Statistics. Springer, New York, NY. https://doi.org/10.1007/978-1-4757-2545-2_12

Download citation

  • DOI: https://doi.org/10.1007/978-1-4757-2545-2_12

  • Publisher Name: Springer, New York, NY

  • Print ISBN: 978-1-4757-2547-6

  • Online ISBN: 978-1-4757-2545-2

  • eBook Packages: Springer Book Archive

Publish with us

Policies and ethics