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The Transmission Electron Microscope

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Abstract

A typical commercial transmission electron microscope (TEM) costs about $2 for each electron volt of energy in the beam, and if you add on all the options, it can cost about $4–5 per eV. As you’ll see, we use beam energies in the range from 100,000–400,000 eV, so a TEM becomes an extremely expensive piece of equipment. Consequently, there have to be very sound scientific reasons for investing such a large amount of money in one microscope. In this chapter (which is just a brief overview of many of the concepts that we’ll talk about in detail throughout the book) we start by introducing you to some of the historical development of the TEM because the history is intertwined with some of the reasons why you need to use a TEM to characterize materials. Other reasons for using TEM appeared as the instrument developed. Unfortunately, coupled with the advantages are some serious drawbacks, which limit the microscope performance, and you must be just as aware of the instrument’s limitations as you are of its advantages, so we summarize these also.

Keywords

  • Transmission Electron Microscope
  • Transmission Electron Microscope Image
  • Scanning Transmission Electron Microscope
  • Beam Damage
  • Microscopy Society

These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

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Williams, D.B., Carter, C.B. (1996). The Transmission Electron Microscope. In: Transmission Electron Microscopy. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-2519-3_1

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  • DOI: https://doi.org/10.1007/978-1-4757-2519-3_1

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-0-306-45324-3

  • Online ISBN: 978-1-4757-2519-3

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