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Diffraction from Small Volumes

  • David B. Williams
  • C. Barry Carter

Abstract

A very important concept in TEM is that we only diffract from small volumes. By definition, no specimens are infinite in all directions and all defects are small. Of course, the beam is also never infinitely wide! This chapter therefore discusses how the size of what we are examining influences the appearance of the DP. Although we will discuss many different aspects of diffraction, there are three important ideas which underlie all this discussion:
  • We are diffracting from small volumes.

  • We are diffracting from crystals.

  • We need to index the DPs we see and relate the patterns to the image.

Keywords

Reciprocal Lattice Diffract Beam Planar Defect Diffuse Scattering Dispersion Surface 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

General References

  1. de Ridder, R., Van Landuyt, J., Gevers, R., and Amelinckx, S. (1968) Phys. stat. sol. 30, 797;CrossRefGoogle Scholar
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  12. Van Landuyt, J., Gevers, R., and Amelinckx, S. (1966) ibid. 18, 167.Google Scholar

Specific References

  1. Carter, C.B. (1984) Phil. Mag. A50, 133.CrossRefGoogle Scholar
  2. Gevers, R. (1971) in Electron Microscopy in Materials Science (Ed. U. Valdrè), p. 302, Academic Press, New York.Google Scholar
  3. Sauvage, M. and Parthé, E. (1972), Acta Cryst. A28, 607.CrossRefGoogle Scholar
  4. Wilson, J.A., Di Salvo, F.J., and Mahajan, S. (1975) Adv. Phys. 24, 117.CrossRefGoogle Scholar

Copyright information

© Springer Science+Business Media New York 1996

Authors and Affiliations

  • David B. Williams
    • 1
  • C. Barry Carter
    • 2
  1. 1.Lehigh UniversityBethlehemUSA
  2. 2.University of MinnesotaMinneapolisUSA

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