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Conclusions and Current Research

  • Duncan Moore Henry Walker
Chapter
Part of the The Springer International Series in Engineering and Computer Science book series (SECS, volume 33)

Abstract

This chapter describes our conclusions and directions of current research. We first discuss what we have learned in the course of this research. We then discuss how this research has contributed to the field of yield modeling and simulation. We then discuss how this work is being extended to improve simulator performance, use new analysis techniques, and how local and global defects can both be combined in one simulator.

Keywords

Local Defect Critical Area Fault Group Fault Analysis Chip Sample 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer Science+Business Media Dordrecht 1987

Authors and Affiliations

  • Duncan Moore Henry Walker
    • 1
  1. 1.Carnegie Mellon UniversityUSA

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