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The Acoustic Microscope: A Tool for Nondestructive Testing

  • J. Attal
Part of the NATO Advanced Study Institutes Series book series (NSSB, volume 46)

Abstract

Historically the microscope has proved to be one of the most powerful scientific tools. This has been especially true in the biological sciences where many of the most significant advances have been founded on microscopic observations. Moreover, each time a microscope based on a new class of radiation has been developed, our understanding of the microscopic structure in nature has been extended. The introduction of acoustic radiation to microscopy can be expected to have a similar impact. This is the motivation underlying the development of the acoustic microscope.

Keywords

Acoustic Wave Acoustic Impedance Spherical Aberration Acoustic Beam Acoustic Microscope 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

  1. 1.
    R. A. Lemons and C. F. Quate, Appl. Phys. Lett. 24, 163–165 (1974).CrossRefGoogle Scholar
  2. 2.
    L. W. Kessler, J. Acoust. Soc. Am. 55, 909–918 (1974).Google Scholar
  3. 3.
    E. Bridoux, B. Nongaillard, J. M. Rouvaen, C. Bruneel, G. Thomin and R. Torguet, J. Appl. Phys. 49, 574–579 (1978).CrossRefGoogle Scholar
  4. 4.
    J. Attal and C. F. Quate, J. Acoust. Soc. Am. 59, 69–73 (1976).CrossRefGoogle Scholar
  5. 5.
    C. F. Quate, Trends in Biochemical Sciences, N 127-N 129 (June 1977).Google Scholar
  6. 6.
    R. A. Lemons and C. F. Quate, Appl. Phys. Lett. 25, 251–253(1974).Google Scholar
  7. 7.
    C. S. Tsai, S. K. Wang and C. C. Lee, Appl. Phys. Lett. 31, 317–320 (1977).CrossRefGoogle Scholar
  8. 8.
    J. Attal and G. Cambon, Electron. Lett. 14, 472–473 (1978).CrossRefGoogle Scholar
  9. 9.
    H. K. Wickramasinghe and M. Hall, Electron. Lett. 12, 637–638 (1976).CrossRefGoogle Scholar
  10. 10.
    R. D. Weglein and R. G. Wilson, Appl. Phys. Lett. 31, 793–796 (1977).CrossRefGoogle Scholar
  11. 11.
    A. Atalar, C. F. Quate and H. K. Wickramasinghe, Appl. Phys. Lett. 31, 791–793 (1977).CrossRefGoogle Scholar
  12. 12.
    J. Attal and G. Cambon, Submitted to Appl. Phys. Lett.Google Scholar
  13. 13.
    R. Kompfner and R. A. Lemons, Appl. Phys. Lett. 28, 295–297 (1976).CrossRefGoogle Scholar
  14. 14.
    H. K. Wickramasinghe and C. Yeack, J. Appl. Phys. 48, 4951–4954 (1977).CrossRefGoogle Scholar
  15. 15.
    W. L. Bond, and C. C. Cutler, R. A. Lemons and C. F. Quate, Appl. Phys. Lett. 27, 270–272 (1975).Google Scholar
  16. 16.
    J. Attal and G. Cambon, Application to the Non-Destructive Evaluation in Microelectronics, UltraSonic Symposium Proceedings IEEE #78 CH1344–15U (1978) (to be published).Google Scholar

Copyright information

© Springer Science+Business Media New York 1979

Authors and Affiliations

  • J. Attal
    • 1
  1. 1.Centre d’Etudes d’Electroniques des SolidesUniversite des Sciences et Techniques du LanguedocMontpelier-CedexFrance

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