Abstract
It is the purpose of this paper to review the problems and possibilities offered by EXAFS studies of materials at high pressures. This is a new field for which high pressure techniques must be refined. Cell designs and methods of measuring the pressure in situ which we have used are indicated. It will be seen that we are currently concerned with the accuracy in measuring bond lengths as a function of pressure and, learning what EXAFS can tell us about pressure-induced structural or electronic phase changes.
Keywords
- Boron Carbide
- EXAFS Signal
- Stanford Synchrotron Radiation Laboratory
- Momentum Transfer Range
- Tungsten Carbide Anvil
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.
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References
R. Ingalls, G. A. Garcia, and E. A. Stern, Phys. Rev. Lett. 40, 334 (1978).
R. Ingalls, E. D. Crozier, J. E. Whitmore, A. J. Seary, and J. M. Tranquada, J. Appl. Phys., to be published.
F. W. Lytle, D. E. Sayers, and E. A. Stern, Phys. Rev. B11, 4825 (1975);
E. A. Stern, D. E. Sayers, and F. W. Lytle, Phys. Rev., B11, 4836 (1975).
S. Yamaoka, O. Shimomura, H. Nakazawa, and O. Kukunaga, Proc. 7th Int. Conf. High Pres. (AIRPT), Pergamon, to be published.
R. Ingalls, J. E. Whitmore, J. M. Tranquada, and E. D. Crozier, Proc. 7th Int. Conf. High Pres. (AIRPT), Pergamon, to be published.
S. N. Vaidya and G. C. Kennedy, J. Phys. Chem. Solids 32, 951 (1971).
V. Meisalo and M. Kalliomäki, High Temp. Pres. 5, 663 (1973).
B. Bunker, private communication.
P. Eisenberger and G. S. Brown, Solid State Comm. 29, 481 (1979).
A. Jayaraman, Proc. 6thInt. Conf. High Pres. (AIRPT), ed. K. D. Timmerhaus and M. S. Barber, Plenum, N.Y. (1979).
E. D. Crozier and A. J. Seary, Can. J. Phys. 58, 1388 (1980);E. D. Crozier, elsewhere in this book.
D. Levesque and J. J. Weis, Phys. Lett. 60A, 473 (1977);
M. Silbert and W. H. Young, Phys. Lett. 58A, 469 (1976).
K. K. Mon, N. W. Ashcroft and G. V. Chester, Phys. Rev. B19, 5103 (1979).
K. H. Brown and J. D. Barnett, J. Chem. Phys. 57, 2009 (1972).
K. H. Brown and J. D. Barnett, J. Chem. Phys. 57, 2016 (1972).
K. Tsuji, H. Endo, S. Minomura, Phil. Mag. 31, 441 (1975).
P. A. Egelstaff, D. I. Page, C. R. T. Heard, J. Phys. C 4, 1453 (1971);
P. A. Egelstaff and S. S. Wang, Can. J. Phys. 50, 2462 (1972).
P. A. Egelstaff and S. S. Wang, Can. J. Phys. 50, 684 (1972).
B. K. Teo and P. A. Lee J. Am. Chem. Soc. 101, 2815 (1979).
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Ingalls, R., Tranquada, J.M., Whitmore, J.E., Crozier, E.D., Seary, A.J. (1981). Extended X-Ray Absorption Fine Structure Studies at High Pressure. In: Teo, B.K., Joy, D.C. (eds) EXAFS Spectroscopy. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-1238-4_8
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