Abstract
Inner shell electrons can be excited not only by the absorption of X-rays but also by the inelastic scattering of fast electrons. The similarity between these two different probes suggests that experiments normally carried out with X-rays may be performed with electrons. This is the case for the Extended X-ray Absorption Fine Structure technique (EXAFS) developed by Sayers, Stern and Lytle.1–5 In this chapter we shall discuss the equivalent use of electron energy loss spectroscopy (EELS) to give information about local atomic environments.
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Leapman, R.D., Grunes, L.A., Fejes, P.L., Silcox, J. (1981). Extended Core Edge Fine Structure in Electron Energy Loss Spectra. In: Teo, B.K., Joy, D.C. (eds) EXAFS Spectroscopy. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-1238-4_18
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DOI: https://doi.org/10.1007/978-1-4757-1238-4_18
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