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The Technical Importance of Growth Defects

  • A. D. Milne
Part of the Nato Advanced Study Institutes Series book series (NSSB, volume 63)

Abstract

The technical importance of defects has already been considered from the viewpoint of the overall manufacturing process. In this chapter a different approach will be taken and the subject considered from the point of view of the device operation.

Keywords

Surface Acoustic Wave Growth Defect Lithium Niobate Liquid Phase Epitaxy Gadolinium Gallium Garnet 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Bibliography

(1) Charge Coupled Devices

  1. Charge Transfer Devices, C.H. Sequin and M.F. Tompsett, Academic Press Inc., New York, (1975)Google Scholar
  2. Proceedings of International Conference on CCDs, Learned Information, New York, (1975)Google Scholar
  3. Charge Coupled Devices and Systems, Ed. Howes and Morgan, Wiley, (1979)Google Scholar

(2) Magnetic Bubble Domain Devices

  1. A.H. Bobeck, Bell System Tech. Journal 46, 1901, (1967)Google Scholar
  2. Magnetic Bubbles, T.H. O’Dell, MacMillan Press Ltd., London, (1974)Google Scholar

(3) Surface Acoustic Wave Devices

  1. IEE Conference Publication 144, The Impact of New Technologies on Signal Processing, Ed. P.M. Grant, (1976)Google Scholar
  2. IEE Reprint Series 2. Surface Acoustic Wave Passive Interdig:itated Devices, Ed. D.P. Morgan, (1976).Google Scholar

Copyright information

© Springer Science+Business Media New York 1980

Authors and Affiliations

  • A. D. Milne

There are no affiliations available

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