An Improved, Highly Sensitive, and Bakeable Microbalance System with a Built-in Calibration Device for Studying Condensation Phenomena Between —128 and 70 C in UHV
Two microbalances, I and II, commonly support a sample pan at the (lower) end of a quartz fiber. System I is an electrostatically compensated balance with a tungsten-wire suspension. System II is mounted at right angles below system I, and has no weighing function.
This arrangement offers several advantages in UHV microbalance techniques. First, sideward pendulum oscillations of the long pan suspension are eliminated. Secondly, this design offers the possibility of using the torsion wires of microbalances I and II as leads for electrical and thermoelectrical measurements on the material deposited on the sample pan.
For the first time it was possible to readjust and calibrate our microbalance system in situ under UHV conditions by stepwise loading the pan with weights ranging from 3 up to 500 µg. Measurements of the temperature-dependent condensation behavior of a Cd -atom beam on quartz pan and simultaneous measurements of electrical film resistance were performed.
KeywordsAtom Beam Compensation Voltage Microbalance System Quartz Fiber Vitreous Silica
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