Originally, spectral analysis was used in seismic exploration to separate two overlapping waves [1–3]. Such methods were based on the use of diagnostic features for the frequency response of a bed. The basis for the method of determining the thickness of a thin bed from diagnostic points on its frequency response characteristic is the assumption that waves are reflected in a similar manner from both the top and the bottom of the bed. This assumption is also made in this presentation. Earlier approaches are generalized in this development by restricting neither the number of interfering waves nor the ratios between their delay times. It is assumed only that the number of interfering waves is finite.


Frequency Spectrum Wave Form Synthetic Seismogram Frequency Response Characteristic Simple Wave 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.


Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

Literature Cited

  1. 1.
    I. S. Berzon, A. M. Epinat’eva, G. N. Pariiskaya, and S. P. Starodubrovskaya, Dynamic Characteristics of Seismic Waves in Real Media, Izd. Akad. Nauk SSSR, 1962.Google Scholar
  2. 2.
    L. L. Khudzinskii, On determining some properties of layers of moderate thickness from the spectrum of reflected waves, Izv. Akad. Nauk SSSR, Ser. Geofiz., No. 5 (1961).Google Scholar
  3. 3.
    M. E. Grin’, Determination of the time delay of waves in an interference zone by use of spectral analysis, Dokl. Akad. Nauk UkSSR, No. 10 (1959).Google Scholar

Copyright information

© Consultants Bureau, New York 1969

Authors and Affiliations

  • S. A. Kats

There are no affiliations available

Personalised recommendations