X-Ray Structure Determination of Polymers
The basic criteria for diffraction is that the wavelength of the incident electromagnetic radiation should be of the same order of magnitude as the distance between scattering particles. This for structure on an atomic scale X-rays are usually used since they have a wavelength ≃ 0.1mm (10−9m); although electrons and neutrons also fall in this wavelength range.
KeywordsReciprocal Lattice Reciprocal Space Diffraction Spot Fibre Axis Layer Line
Unable to display preview. Download preview PDF.
Suggestion for Further Reading
- Diffraction of X-rays by Chain Molecules by B.K. Vainshtein, 1966, Elsevier, Amsterdam.Google Scholar
- X-ray Diffraction Methods in Polymer Science by L. Alexander, 1969, Wiley-Interscience, New York.Google Scholar
- X-ray Diffraction by Polymers by M. Kakudo and N. Kasai, 1972, Elsevier Pub. Co. Amsterdam.Google Scholar
- X-ray Diffraction in Crystals, Imperfect Crystals abd Amorphous Bodies by A. Guinier, 1963, Freeman & Co. San Francisco.Google Scholar
- Elements of X-ray Diffraction by B.D. Cullity, 1956, Addison-Wesley, London.Google Scholar
- Optical Transforms by C.A. Taylor and H, Lipson, 1964, Bell and Sons Ltd., London.Google Scholar
- Diffraction of X-rays by Proteins, Nuclei Acids and Viruses by H.R. Wilson, 1966, Edward Arnold, London.Google Scholar
- X-ray Crystallography by M.J. Buerger, 1962, John Wiley, London.Google Scholar
- Chemical Crystallography by C.W. Bunn, 1945, Oxford Press.Google Scholar