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Crystallization and Melting in Multilayered Structures

  • W. Sevenhans
  • J. P. Locquet
  • H. Vanderstraeten
  • Y. Bruynserade
  • H. Homma
  • I. K. Schuller

Abstract

Pb/Ge multilayers were prepared in a load-locked MBE apparatus equipped with two electron beam guns. The evaporation rates were controlled using a quadrupole mass spectrometer in feedback mode. Pb/Ge multilayers were prepared using a microprocessor controlled shutter, to alternately expose the liquid nitrogen cooled sapphire substrates to the flux of evaporant.

Keywords

Multilayered Structure Feedback Mode High Angle Diffraction Mosaic Spreadth Wide Angle Reflection 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Copyright information

© Plenum Press, New York 1988

Authors and Affiliations

  • W. Sevenhans
    • 1
  • J. P. Locquet
    • 1
  • H. Vanderstraeten
    • 1
  • Y. Bruynserade
    • 1
  • H. Homma
    • 2
  • I. K. Schuller
    • 2
  1. 1.Laboratorium voor Vaste Stof-Fysika en MagnetismeKatholieke Universiteit, LeuvenLeuvenBelgium
  2. 2.Materials Science DivisionArgonne National LaboratoryArgonneUSA

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