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Reliability Considerations

  • Jerry C. Whitaker

Abstract

The ultimate goal of any design engineer or maintenance department is zero downtime. This is an elusive goal, but one that can be approximated by examining the vulnerable areas of plant operation and taking steps to prevent a sequence of events that could result in system failure. In cases where failure prevention is not practical, a reliability assessment should encompass the stocking of spare parts, circuit boards, or even entire systems. A large facility may be able to cost-justify the purchase of backup gear that can be used as spares for the entire complex. Backup hardware is expensive, but so is downtime. Because of the finite lifetime of power vacuum tubes, these considerations are of special significance.

Keywords

Solder Joint Vacuum Tube Device Under Test Reliability Growth Fault Tree Analysis 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Bibliography

  1. Anderson, Leonard R., Electric Machines and Transformers, Reston Publishing Company, Reston, VA.Google Scholar
  2. Brauer, D. C., and G. D. Brauer,“Reliability-Centered Maintenance,” Proceedings of the IEEE Reliability and Maintainability Symposium, IEEE, New York, 1987.Google Scholar
  3. Cameron, D., and R. Walker,“Run-In Strategy for Electronic Assemblies,” Proceedings of the IEEE Reliability and Maintainability Symposium, IEEE, New York, 1986.Google Scholar
  4. Capitano, J., and J. Feinstein,“Environmental Stress Screening Demonstrates Its Value in the Field,” Proceedings of the IEEE Reliability and Maintainability Symposium, IEEE, New York, 1986.Google Scholar
  5. Clark, Richard J.,“Electronic Packaging and Interconnect Technology Working Group Report (IDA/OSD R&M Study),” IDA Record Document D-39, Institute of Defense Analysis, August 1983.Google Scholar
  6. “Cleaning and Flushing Klystron Water and Vapor Cooling Systems,” Application Engineering Bulletin no. AEB-32, Varian Associates, Palo Alto, CA, 1982.Google Scholar
  7. “Cleaning UHF-TV Klystron Ceramics,” Technical Bulletin no. 4537, Varian Associates, Palo Alto, CA, May 1982.Google Scholar
  8. “Conditioning of Large Radio-Frequency Power Tubes,” Application Bulletin no. 21, Varian/Eimac, San Carlos, CA, 1984.Google Scholar
  9. Des-Plas, Edward,“Reliability in the Manufacturing Cycle,” Proceedings of the IEEE Reliability and Maintainability Symposium, IEEE, New York, 1986.Google Scholar
  10. Devaney, John,“Piece Parts ESS in Lieu of Destructive Physical Analysis,” Proceedings of the IEEE Reliability and Maintainability Symposium, IEEE, New York, 1986.Google Scholar
  11. Dick, Brad,“Caring for High-Power Tubes,” Broadcast Engineering, Intertec Publishing, Overland Park, KS, pp. 48 – 58, November 1991.Google Scholar
  12. Dick, Brad,“Caring for High-Power Tubes,” Broadcast Engineering, Intertec Publishing, Overland Park, KS, pp. 48 – 58, November 1991.Google Scholar
  13. “Extending Transmitter Tube Life,” Application Bulletin no. 18, Varian/Eimac, San Carlos, CA, 1990.Google Scholar
  14. “Fault Protection,” Application Bulletin no. 17, Varian/Eimac, San Carlos, CA, 1987.Google Scholar
  15. “55 kW Integral Cavity Klystron Arc Shields,” Technical Bulletin no. 4441, Varian Associates, Palo Alto, CA, April 1981.Google Scholar
  16. Fink, D., and D. Christiansen (eds.), Electronics Engineers’ Handbook, 3rd Ed., McGrawHill, New York, 1989.Google Scholar
  17. Fortna, H., R. Zavada, and T. Warren,“An Integrated Analytic Approach for Reliability Improvement,” Proceedings of the IEEE Reliability and Maintainability Symposium, IEEE, New York, 1990.Google Scholar
  18. Frey, R., G. Ratchford, and B. Wendling,“Vibration and Shock Testing for Computers,” Proceedings of the IEEE Reliability and Maintainability Symposium, IEEE, New York, 1990.Google Scholar
  19. Griffin, P.,“Analysis of the F/A-18 Hornet Flight Control Computer Field Mean Time Between Failure,” Proceedings of the IEEE Reliability and Maintainability Symposium, IEEE, New York, 1985.Google Scholar
  20. Hansen, M. D., and R. L. Watts,“Software System Safety and Reliability,” Proceedings of the IEEE Reliability and Maintainability Symposium, IEEE, New York, 1988.Google Scholar
  21. Hermason, Sue E., Major, USAF. Letter dated December 2, 1988. From: Yates, W., and D. Shaller,“Reliability Engineering as Applied to Software,” Proceedings of the IEEE Reliability and Maintainability Symposium, IEEE, New York, 1990.Google Scholar
  22. High Power Transmitting Tubes for Broadcasting and Research, Philips Technical Publication, Eindhoven, the Netherlands, 1988.Google Scholar
  23. Hobbs, Gregg K.,“Development of Stress Screens,” Proceedings of the IEEE Reliability and Maintainability Symposium, IEEE, New York, 1987.Google Scholar
  24. Horn, R., and F. Hall,“Maintenance Centered Reliability,” Proceedings of the IEEE Reliability and Maintainability Symposium, IEEE, New York, 1983.Google Scholar
  25. Irland, Edwin A.,“Assuring Quality and Reliability of Complex Electronic Systems: Hardware and Software,” Proceedings of the IEEE, Vol. 76, no. 1, IEEE, New York, January 1988.Google Scholar
  26. Jordan, Edward C., Reference Data for Engineers: Radio, Electronics, Computer, and Communications, 7th Ed., Howard W. Sams, Indianapolis, IN, 1985.Google Scholar
  27. Kenett, R., and M. Pollak,“A Semi-Parametric Approach to Testing for Reliability Growth, with Application to Software Systems,” IEEE Transactions on Reliability, IEEE, New York, August 1986.Google Scholar
  28. Laboratory Staff, The Care and Feeding of Power Grid Tubes, Varian EIMAC, San Carlos, CA, 1984.Google Scholar
  29. Maynard, Egbert,“OUSDRE Working Group, VHSIC Technology Working Group Report (IDA/OSD R&M Study),” Document D-42, Institute of Defense Analysis, November 1983.Google Scholar
  30. Meeldijk, Victor,“Why Do Components Fail?” Electronic Servicing and Technology, Intertec Publishing, Overland Park, KS, November 1986.Google Scholar
  31. Nenoff, Lucas,“Effect of EMP Hardening on System R&M Parameters,” Proceedings of the 1986 Reliability and Maintainability Symposium, IEEE, New York, 1986.Google Scholar
  32. Neubauer, R. E., and W. C. Laird,“Impact of New Technology on Repair,” Proceedings of the IEEE Reliability and Maintainability Symposium, IEEE, New York, 1987.Google Scholar
  33. Pearman, Richard, Power Electronics, Reston Publishing Company, Reston, VA, 1980.Google Scholar
  34. Powell, Richard,“Temperature Cycling vs. Steady-State Burn-In,” Circuits Manufacturing, Benwill Publishing, September 1976.Google Scholar
  35. “Power Grid Tubes for Radio Broadcasting,” Publication no. DTE-115, Thomson-CSF, Dover, NJ, 1986.Google Scholar
  36. “Recommendations for Protection of 4KM Series Klystrons During Prime Power Interruptions,” Technical Bulletin no. 3542, Varian Associates, Palo Alto, CA.Google Scholar
  37. “Reconditioning of UHF-TV Klystron Electron Gun Elements,” Technical Bulletin no. 4867, Varian Associates, Palo Alto, CA, July 1985.Google Scholar
  38. “Reduced Heater Voltage Operation,” Technical Bulletin no. 4863, Varian Associates, Palo Alto, CA, June 1985.Google Scholar
  39. Robinson, D., and S. Sauve,“Analysis of Failed Parts on Naval Avionic Systems,” Report no. D180–22840-1, Boeing Company, October 1977.Google Scholar
  40. Spradlin, B. C.,“Reliability Growth Measurement Applied to ESS,” Proceedings of the IEEE Reliability and Maintainability Symposium, IEEE, New York, 1986.Google Scholar
  41. Svet, Frank A.,“Factors Affecting On-Air Reliability of Solid State Transmitters,” Proceedings of the SBE Broadcast Engineering Conference, Society of Broadcast Engineers, Indianapolis, IN, October 1989.Google Scholar
  42. Technical Staff, Military/Aerospace Products Division, The Reliability Handbook, National Semiconductor, Santa Clara, CA, 1987.Google Scholar
  43. Tube Topics: A Guide for Vacuum Tube Users in a Transistorized World, Econco Broadcast Service, Woodland, CA, 1990.Google Scholar
  44. Tustin, Wayne,“Recipe for Reliability: Shake and Bake,” IEEE Spectrum, IEEE, New York, December 1986.Google Scholar
  45. “UHF-TV Klystron Focusing Electromagnets,” Technical Bulletin no. 3122, Varian Associates, Palo Alto, CA, November 1973.Google Scholar
  46. Whitaker, J. C., Maintaining Electronic Systems, CRC Press, Boca Raton, FL, 1992.Google Scholar
  47. Whitaker, J. C., Radio Frequency Transmission Systems: Design and Operation, McGraw-Hill, New York, 1990.Google Scholar
  48. Wilson, M. F., and M. L. Woodruff,“Economic Benefits of Parts Quality Knowledge,” Proceedings of the IEEE Reliability and Maintainability Symposium, IEEE, New York, 1985.Google Scholar
  49. Wilson, Sam,“What Do You Know About Electronics,” Electronic Servicing and Technology, Intertec Publishing, Overland Park, KS, September 1985.Google Scholar
  50. Wong, K. L.,“Demonstrating Reliability and Reliability Growth with Environmental Stress Screening Data,” Proceedings of the IEEE Reliability and Maintainability Symposium, IEEE, New York, 1990.Google Scholar
  51. Wong, K. L., I. Quart, L. Kallis, and A. H. Burkhard,“Culprits Causing Avionics Equipment Failures,” Proceedings of the IEEE Reliability and Maintainability Symposium, IEEE, New York, 1987.Google Scholar
  52. Worm, Charles M.,“The Real World: A Maintainer’s View,” Proceedings of the IEEE Reliability and Maintainability Symposium, IEEE, New York, 1987.Google Scholar

Copyright information

© Springer Science+Business Media New York 1994

Authors and Affiliations

  • Jerry C. Whitaker

There are no affiliations available

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